Dr. Wenbing Yun and Dr. Benjamin Stripe will be attending the annual Denver X-ray Conference. They plan on discussing Sigray's newest advances in x-ray instrumentation, enabled by the patented FAAST x-ray source.
Sigray will be attending and plans to discuss its high brightness FAAST source and advances in automated x-ray optics characterization.
Sigray will be attending the annual Microscopy & Microanalysis conference, presenting its AttoMap x-ray analytical microscope and its future system developments.
Dr. Wenbing Yun will be presenting at ICO-24 in Tokyo, Japan.
Dr. Yun will be presenting at the 5th Dresden Nanoanalysis Symposium held on the Fraunhofer Campus Dresden on September 1st, 2017.
Sigray is a proud gold sponsor of the XNPIG conference, focused on grating-based imaging. Dr. Wenbing Yun will be presenting on Sigray's advances in components and system technology for x-ray phase imaging, including its revolutionary FAAST-Phase source designed for phase contrast imaging.
Prof. Janos Kirz will be presenting Sigray's patented x-ray source and optics for high throughput x-ray crystallographic applications at the American Crystallographic Association held in New Orleans, Louisiana.
The ACA Meeting is an annual event providing scientists from a wide variety of backgrounds the opportunity to exchange cutting edge ideas and techniques in multiple areas of research. Each meeting highlights various aspects of crystallography and demonstrates their significance to the greater scientific community.
SH Lau, Vice President of Business Development at Sigray, will be delivering an oral presentation entitled "Non-invasive lab tool for micron-level trace element mapping and contamination analysis in FA & process control with capabilities comparable to synchrotron-based microXRF".
Dr. Yun will be attending the XOPT conference in Yokohama, Japan
Dr. Wenbing Yun will be giving an oral presentation on recent x-ray spectroscopy developments at the 253rd national meeting of the ACS.
SH Lau will be presenting on Sigray's latest developments for high throughput compositional mapping of trace elements and contaminants at micron-scale in micron-scale in wafer and packaging.
Dr. Wenbing Yun will be presenting at the NIST workshop on X-ray Metrology for the Semiconductor Industry in Gaithersburg, MD. Discussed in the workshop will be new approaches and techniques for Critical Dimension Small Angle X-ray Scattering (CD-SAXS).
Dr. Yun will be attending the International Conference on X-ray Microscopy this year and presenting on Sigray's synchrotron x-ray mirror lens technology and the development of its XCITE microbeam technology for laboratory instrumentation development.
Sigray will be presenting two papers at the annual M&M conference this year, one on standardless quantification using the XCITE and another on its revolutionary x-ray source and optics technologies.
Dr. Wenbing Yun will be attending as an invited speaker at IRSP 2016 and presenting on X-ray Microdiffraction with Structured Illumination for Strain Measurement in Nanoelectronics
Dr. Wenbing Yun and Benjamin Stripe will be representing Sigray at the 2016 Denver X-ray Conference held this year in Rosemont, Illinois.