ACA: American Crystallographic Association
May
26
to May 30

ACA: American Crystallographic Association

Prof. Janos Kirz will be presenting Sigray's patented x-ray source and optics for high throughput x-ray crystallographic applications at the American Crystallographic Association held in New Orleans, Louisiana.

The ACA Meeting is an annual event providing scientists from a wide variety of backgrounds the opportunity to exchange cutting edge ideas and techniques in multiple areas of research. Each meeting highlights various aspects of crystallography and demonstrates their significance to the greater scientific community.

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Fraunhofer CAM: Innovation in Failure Analysis and Material Diagnostics of Electronic Components
Apr
26
to Apr 27

Fraunhofer CAM: Innovation in Failure Analysis and Material Diagnostics of Electronic Components

SH Lau, Vice President of Business Development at Sigray, will be delivering an oral presentation entitled "Non-invasive lab tool for micron-level trace element mapping and contamination analysis in FA & process control with capabilities comparable to synchrotron-based microXRF".

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X-ray Microscopy 2016
Aug
15
to Aug 19

X-ray Microscopy 2016

  • University of Oxford, UK (map)
  • Google Calendar ICS

Dr. Yun will be attending the International Conference on X-ray Microscopy this year and presenting on Sigray's synchrotron x-ray mirror lens technology and the development of its XCITE microbeam technology for laboratory instrumentation development.

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