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14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics


  • Hotel Elbresidenz Bad Schandau 1 Marktplatz Bad Schandau, SN, 01814 Germany (map)

Dr. Wenbing Yun will be attending as an invited speaker the 14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics - Experimentation and Simulation in Dresden, Germany. He will present on Sigray's technology and its potential to significantly change the throughput and sensitivity of inline microdiffraction for strain and stress measurements in the semiconductor industry.

The conference centers around stresses that arise from metal structures and surrounding dielectric materials in micro and nanoelectronics products. 

http://irsp2016.malab.com/wp-content/uploads/2016/02/14-IC-IRSP_2016_3rd_announcement.pdf

Earlier Event: March 24
Denver X-ray Conference
Later Event: July 24
Microscopy and Microanalysis 2016
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