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Microscopy and Microanalysis 2016

  • Columbus Convention Center 400 North High Street Columbus, OH, 43215 United States (map)

Sigray will be presenting two papers at the annual Microscopy & Microanalysis meeting held this year in Columbus, Ohio:

  • Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation
  • Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe