Dr. Wenbing Yun will be presenting at the NIST workshop on X-ray Metrology for the Semiconductor Industry in Gaithersburg, MD. Discussed in the workshop will be new approaches and techniques for Critical Dimension Small Angle X-ray Scattering (CD-SAXS).
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Earlier Event: August 15X-ray Microscopy 2016
Later Event: November 6International Symposium for Testing and Failure Analysis 2016