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Fraunhofer CAM: Innovation in Failure Analysis and Material Diagnostics of Electronic Components

  • Leibniz IAMO 2 Theodor-Lieser-Straße Halle (Saale), SA, 06120 Germany (map)

SH Lau, Vice President of Business Development at Sigray, will be delivering an oral presentation entitled "Non-invasive lab tool for micron-level trace element mapping and contamination analysis in FA & process control with capabilities comparable to synchrotron-based microXRF". In it, he will show examples of the utility of high throughput parts-per-million non-destructive chemical analysis of semiconductor samples in comparison to conventional methods such as FIB followed by EDS.

The talk will be held in Germany at the 6th Fruanhofer CAM workshop in April, which will gather industry leaders to discuss new methods of addressing the increasingly complex System in Package and 3D Integration requirements in inspection and failure analysis. Details of the workshop can be found here: