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Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI

  • San Diego Convention Center 111 W Harbor Dr San Diego, CA 92101 (map)

Sigray will be attending and discussing its patented high brightness FAAST (fine array anode source technology) laboratory source and advances in automated x-ray optics characterization. In particular, we will discuss both the limitation of laboratory x-ray source brightness and the need for improvements for higher efficiency and higher resolution x-ray optics in order to efficiently utilize ultrahigh brightness x-ray sources.

About SPIE - Advances in Laboratory-based X-ray Sources, Optics, and Applications VI: This SPIE conference focuses on topics concerning the continued demand for brighter laboratory-based x-ray beams (x-ray sources and x-ray optics) for a variety of industrial, medical, and scientific applications.

To schedule a meeting during SPIE with a Sigray representative to discuss custom optics designs or other Sigray products, please fill out the form below:

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Earlier Event: July 31
Denver X-ray Conference 2017
Later Event: August 6
Microscopy & Microanalysis 2017