How SIGRAY IS disrupting x-ray TechnologY:
X-ray Microbeam system
Dr. Wenbing Yun will be attending as an invited speaker at IRSP 2016 and presenting on X-ray Microdiffraction with Structured Illumination for Strain Measurement in Nanoelectronics
Sigray will be presenting two papers at the annual M&M conference this year, one on standardless quantification using the XCITE and another on its revolutionary x-ray source and optics technologies.
Dr. Yun will be attending the International Conference on X-ray Microscopy this year and presenting on Sigray's synchrotron x-ray mirror lens technology and the development of its XCITE microbeam technology for laboratory instrumentation development.