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In Situ and In Operando

Sigray's products were designed to optimize performance for time-based studies of samples in situ (e.g. on flow or fracturing), measuring changes to composition, chemical state, and microstructure.

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ELEMENTAL DISTRIBUTION

The distribution of elements and their relative quantities are key determinants of how a material performs or how efficiently a natural resource can be extracted.

With its ultrahigh (sub-ppm) sensitivity and microns-scale resolution, the AttoMap enables accurate quantification of trace elements and contaminants at higher sensitivity than electron microprobes.

 

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Multi-Length Scale & Correlative

X-rays are ideal for non-destructive, rapid surveys at microns-scale resolution. Correlative applications include:

•Sub-ppm trace elemental mapping for higher sensitivity to complement electron microscopy (e.g. QEMSCAN, MLA)

Identify ROIs for destructive FIB-SEM

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Quantitative Coating or Buried Layer Thickness 

Spatially resolved thickness variations of buried layers and coatings can be analyzed without requiring standards.

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